THANK YOU, REVIEWERS!
Following is a list of individuals who provided peer review for Materials Evaluation
from 1 January to 31 December 2024. On behalf of the editors of Materials
Evaluation and the staff of the American Society for Nondestructive Testing, we
extend our sincere and heartfelt gratitude for your contributions to the literature in
the field of nondestructive testing. Together, we are creating a safer world.
Ñ Ali Abdul-Aziz*‡
Ñ Farzaneh Ahmadi
Ñ Eunjong Ahn
Ñ Abdelhakim Al Turk
Ñ Sreenivas Alampalli*‡
Ñ John Aldrin*‡
Ñ Michael Allgaier**
Ñ Mohammad Ebrahim Bajgholi
Ñ Dana Begun
Ñ Matthew Belding
Ñ Katelyn Brinker
Ñ Eric Burke
Ñ Sunil Kishore Chakrapani
Ñ Veronique Chayer
Ñ John Z. Chen§
Ñ Zhenmao Chen
Ñ Wonjae Choi
Ñ Tsuchin (Philip) Chu
Ñ Yufei Chu
Ñ Pavel Chukachev
Ñ Peter Collins
Ñ Elliott Cramer
Ñ Bruce Crouse‡
Ñ Alireza Enshaeian
Ñ Aqeel Fadhil
Ñ Dave Farson*‡
Ñ Huidong Gao†‡
Ñ Greg Garcia
Ñ Samuel Glass
Ñ T. Gurunathan
Ñ Mohammad Harb
Ñ Ahmed Hassen
Ñ Will Haworth
Ñ Sohichi Hirose
Ñ Stephen Holland
Ñ Ming Huang
Ñ Xuhui Huang
Ñ Ata Jafarzadeh
Ñ Samantha Johnson
Ñ Bryce Jolley
Ñ Yihua Kang
Ñ Gun Kim
Ñ Jin-Yeon Kim*‡
Ñ Sang Kim
Ñ Naresh Kumar
Ñ Erin Lanigan
Ñ Jaesun Lee
Ñ Junrui Li
Ñ Shuai Li
Ñ Zenghua Liu
Ñ Mark Lozev
Ñ Megan McGovern‡
Ñ Mani Mina*‡
Ñ Saptarshi Mukherjee†‡
Ñ Samir Mustapha‡
Ñ Jeong Na
Ñ Peter Nagy
Ñ Kazuyuki Nakahata
Ñ Andrew Norris
Ñ Mubaraq Onifade
Ñ Yi-Ching (Peter) Pan*‡
Ñ Guanyu Piao
Ñ Jean-Francois Poncelet
Ñ Caleb Rascon
Ñ Donald Roth*‡
Ñ Ram Samy*‡
Ñ Rosemarie Sanders
Ñ Ryan Scott
Ñ Connor Seavers
Ñ Hakki Erhan Sevil
Ñ Steven Shepard*‡
Ñ Olga Skowronek
Ñ John Snell
Ñ Peter Spaeth
Ñ Robert Spring
Ñ Lina Spross
Ñ Letchuman Sripragash
Ñ Rod Stanley*‡
Ñ Hong-Bin Sun
Ñ Julian Tao
Ñ Kunal Tiwari
Ñ Sergey Vinogradov
Ñ Zhiyong Wang
Ñ Casper Wassink
Ñ Matt Webster
Ñ Logan Wilcox
Ñ William Winfree
Ñ Jianbo Wu
Ñ Kalpana Yadav
Ñ Suhaib Zafar
Ñ Ali Zare Hosseinzadeh
Ñ Boyang Zhang
Ñ Peter Zhu
Ñ Bozhou Zhuang
*Associate Technical Editor
Contributing Editor
ME Committee Member
§ Technical Editor and Chair of ME Committee
**Guest Editor of a Technical Focus Issue
F E B R U A R Y 2 0 2 5 M A T E R I A L S E V A L U A T I O N 67
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Conventional UT &Phased Array Systems
Automated Eddy Current Systems
Aumomated Portable X-Y Scanners
Contour-following &3D Software
www.tecscan.ca (1)450.233.4973 info@tecscan.ca
Automated NDT SCANNERS
ECHO Series hand held Corrosion, Precision
and Flaw Detector Gage
3.5” color, sunlight
readable display
Software features
include A-Scan, B-scan,
Echo to Echo and
Extensive Datalogger
with export to Excel™
Re-chargeable batteries
13-27 hour battery life
Uses Dual and Single Element Probes
Designed for IP67 rating
Made in USA
Quality manufacturer of Ultrasound
Inspection products
www.danatronics.com
Danvers, MA
978-777-0081
sales@danatronics.com
ECHO PRO Flaw Detector with Touch Screen
Bright, sunlight readable
7” Wide VGA touch
screen display
Features include
datalogging, 2 gages,
DAC, AWS, B-scan, Wi-
Fi, Bluetooth, API-5Ue,
extended range, TVG,
Back ECHO Attenuation,
Interface Gate, Damping
and Energy
10+ hours continuous battery life
Designed for IP67 rating
Made in USA
Danatronics Color_June2024Rev 1 7/8/24 2:09 PM
SERVICES&RESOURCES
siui@siui.com
www.siui.com
#RopeAccess Ultrasonic
Flaw Detector
68
M A T E R I A L S E V A L U A T I O N F E B R U A R Y 2 0 2 5
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