Materials Evaluation Subject Index
1942 to 2023
ME Subject Index 1942 to 2023 page 29
B
Back to Basics, Nondestructive Testing of Ceramic Materials, Ali Abdul-Aziz, ME, Vol. 64, No. 1, January 2006, pp.
20-22.
Back to Basics: 100 Percent X-Ray Weld Inspection: A Real-Time Imaging System for Large Diameter Steel Pipe
Manufacturing, Gary R. Stone, David Gilblom and David Lehmann, ME, Vol. 54, No. 2, February 1996, pp. 132–
134, 136–137.
Back to Basics: A Basic Artificial Intelligence Application, Frank Iddings, ME, Vol. 58, No. 1, January 2000, pp. 33-
34.
Back to Basics: A Basis for Traceable NDE Measurements, Part 1, D.G. Eitzen, Harold Berger and G. Birnbaum, ME,
Vol. 39, No. 9, August 1981, pp. 797–798.
Back to Basics: A Basis for Traceable NDE Measurements, Part 2, D.G. Eitzen, Harold Berger and G. Birnbaum, ME,
Vol. 39, No. 10, September 1981, pp. 886–888.
Back to Basics: A Brief Look at the Low-Energy Radiography of Composite Materials, George L. Becker, ME, Vol.
43, No. 6, May 1985, pp. 596, 598.
Back to Basics: A Computerized Ultrasonic Scanner for $750?, Daniel J. Chwirut, ME, Vol. 40, No. 11, October
1982, pp. 1142–1144 Erratum, ME, Vol. 40, No. 13, December 1982, p. 1340.
Back to Basics: A Critical Commentary on Magnetic Particle Inspection Revisited, Stuart Kleven, Edward J. Piecko
and Timothy Hughes, ME, Vol. 55, No. 1, January 1997, pp. 23–24.
Back to Basics: A Note about Toneburst Ultrasonic Instruments, John A. Brunk, ME, Vol. 48, No. 4, April 1990, pp.
452–455.
Back to Basics: A Program for Training and Hiring NDE Technicians, Donald W. Dunavant and David Frank Rosow,
ME, Vol. 44, No. 11, October 1986, pp. 1272, 1278, 1280–1281.
Back to Basics: A Quick and Accurate Method for the Selection of Filters for Use with Be-Window X-Ray Units,
Don McBride, ME, Vol. 43, No. 1, January 1985, pp. 24–25.
Back to Basics: A Surprise Fix to a Sticky Problem, Emmanuel P. Papadakis, ME, Vol. 59, No. 12, December 2001,
pp. 1377-1378.
Back to Basics: A UK Perspective on Known Discontinuity Standards, Peter Stephens, ME, Vol. 60, No. 6, June
2002, pp. 695-696.
Back to Basics: Acoustic Emission Inspection, D.L. Parry, ME, Vol. 39, No. 11, October 1981, pp. 1004–1005.
Back to Basics: Acoustic Emission Testing: A Composite Manufacturer’s Experience, Jess R. Richter, ME, Vol. 57,
No. 5, May 1999, pp. 492-493.
Back to Basics: Adding and Maintaining Bubble-Free Water in Ultrasonic Scanning Systems, David L. Petricola,
ME, Vol. 65, No. 9, September 2007, pp. 875-880.
Back to Basics: Aircraft Corrosion, Joseph E. Stump, ME, Vol. 61, No. 10, October 2003, pp. 1111-1114.
Back to Basics: Alternating Current Field Measurement: Getting New Technologies Accepted by Old Industries,
Alan Raine and Bob Cameron, ME, Vol. 60, No. 3, March 2002, pp. 389-395.
Back to Basics: Alternative Quantitative Methods for Screening Penetrant Testing Cleaning Solutions, Scott
Grendahl, ME, Vol. 59, No. 1, January 2001, pp. 26-34.
Back to Basics: An Introduction to Fracture Mechanics for Engineers and NDE Specialists, Part 1, M.F. Kanninen,
ME, Vol. 42, No. 4, April 1984, pp. 370–371.
Back to Basics: An Introduction to Fracture Mechanics for Engineers and NDE Specialists, Part 2, M.F. Kanninen,
ME, Vol. 42, No. 6, May 1984, pp. 658, 660, 662.
Back to Basics: An Introduction to Nondestructive Testing, Paul Dick, ME, Vol. 35, No. 9, September 1977, pp. 26,
28, 30, 32, 34, 36, 38, 40, 42, 44, 46.
Back to Basics: An Introduction to Nondestructive Testing, Paul Dick, ME, Vol. 35, No. 10, October 1977, pp. 31–
36.
Back to Basics: An Overview of the Nondestructive Inspection Techniques for Coiled Tubing and Pipe, Roderic K.
Stanley, ME, Vol. 54, No. 11, November 1996, pp. 1245–1250.
Back to Basics: An Untypical Fluorescent Penetrant Evaluation, William H. Bailey, ME, Vol. 40, No. 13, December
1982, pp. 1336, 1338–1340.
Back to Basics: Application of Nondestructive Inspection Methods to Composites, Thomas S. Jones and Harold
Berger, ME, Vol. 47, No. 4, April 1989, pp. 390–391, 393–398, 400.
Back to Basics: Application-Specific Thermal Imaging, John Newitt, ME, Vol. 45, No. 5, May 1987, pp. 500, 502,
504.
Back to Basics: Assuring NDT Radiographic Processing, George L. Becker, ME, Vol. 37, No. 8, July 1979, pp. 26–29.
Back to Basics: ASTM E-1417 Penetrant System Check: New Requirements and Test Pieces, Sam J. Robinson and
Amos Sherwin, ME, Vol. 57, No. 11, November 1999, pp. 1137-1141.
Back to Basics: Automated Leak Testing, Stuart Giles, ME, Vol. 42, No. 2, February 1984, pp. 146–149.
Back to Basics: Automated NDT, Frank A. Iddings, ME, Vol. 42, No. 12, November 1984, p. 1421.
Back to Basics: Back to Basics Without Going Backward: An Editorial, Frank Iddings, ME, Vol. 51, No. 1, January
1993, p. 17.
Back to Basics: Basics for Badges, Frank A. Iddings, ME, Vol. 61, No. 5, May 2003, pp. 565-566.
Back to Basics: Basics of Computed Tomography, Claudia Kropas-Hughes and S. Trent Neet, ME, Vol. 58, No. 5,
May 2000, pp. 630-633.
Back to Basics: Beam Sweeping and Encoded Phased Array Units, J. Mark Davis and Michael Moles, ME, Vol. 65,
No. 6, June 2007, pp. 539-541.
Back to Basics: Benefits and Limitations of Multiplexers in Ultrasonic Systems, L. Byron Makarwich, ME, Vol. 47,
No. 7, July 1989, pp. 777–778, 780 Erratum, ME, Vol. 47, No. 12, December 1989, p. 1424.
1942 to 2023
ME Subject Index 1942 to 2023 page 29
B
Back to Basics, Nondestructive Testing of Ceramic Materials, Ali Abdul-Aziz, ME, Vol. 64, No. 1, January 2006, pp.
20-22.
Back to Basics: 100 Percent X-Ray Weld Inspection: A Real-Time Imaging System for Large Diameter Steel Pipe
Manufacturing, Gary R. Stone, David Gilblom and David Lehmann, ME, Vol. 54, No. 2, February 1996, pp. 132–
134, 136–137.
Back to Basics: A Basic Artificial Intelligence Application, Frank Iddings, ME, Vol. 58, No. 1, January 2000, pp. 33-
34.
Back to Basics: A Basis for Traceable NDE Measurements, Part 1, D.G. Eitzen, Harold Berger and G. Birnbaum, ME,
Vol. 39, No. 9, August 1981, pp. 797–798.
Back to Basics: A Basis for Traceable NDE Measurements, Part 2, D.G. Eitzen, Harold Berger and G. Birnbaum, ME,
Vol. 39, No. 10, September 1981, pp. 886–888.
Back to Basics: A Brief Look at the Low-Energy Radiography of Composite Materials, George L. Becker, ME, Vol.
43, No. 6, May 1985, pp. 596, 598.
Back to Basics: A Computerized Ultrasonic Scanner for $750?, Daniel J. Chwirut, ME, Vol. 40, No. 11, October
1982, pp. 1142–1144 Erratum, ME, Vol. 40, No. 13, December 1982, p. 1340.
Back to Basics: A Critical Commentary on Magnetic Particle Inspection Revisited, Stuart Kleven, Edward J. Piecko
and Timothy Hughes, ME, Vol. 55, No. 1, January 1997, pp. 23–24.
Back to Basics: A Note about Toneburst Ultrasonic Instruments, John A. Brunk, ME, Vol. 48, No. 4, April 1990, pp.
452–455.
Back to Basics: A Program for Training and Hiring NDE Technicians, Donald W. Dunavant and David Frank Rosow,
ME, Vol. 44, No. 11, October 1986, pp. 1272, 1278, 1280–1281.
Back to Basics: A Quick and Accurate Method for the Selection of Filters for Use with Be-Window X-Ray Units,
Don McBride, ME, Vol. 43, No. 1, January 1985, pp. 24–25.
Back to Basics: A Surprise Fix to a Sticky Problem, Emmanuel P. Papadakis, ME, Vol. 59, No. 12, December 2001,
pp. 1377-1378.
Back to Basics: A UK Perspective on Known Discontinuity Standards, Peter Stephens, ME, Vol. 60, No. 6, June
2002, pp. 695-696.
Back to Basics: Acoustic Emission Inspection, D.L. Parry, ME, Vol. 39, No. 11, October 1981, pp. 1004–1005.
Back to Basics: Acoustic Emission Testing: A Composite Manufacturer’s Experience, Jess R. Richter, ME, Vol. 57,
No. 5, May 1999, pp. 492-493.
Back to Basics: Adding and Maintaining Bubble-Free Water in Ultrasonic Scanning Systems, David L. Petricola,
ME, Vol. 65, No. 9, September 2007, pp. 875-880.
Back to Basics: Aircraft Corrosion, Joseph E. Stump, ME, Vol. 61, No. 10, October 2003, pp. 1111-1114.
Back to Basics: Alternating Current Field Measurement: Getting New Technologies Accepted by Old Industries,
Alan Raine and Bob Cameron, ME, Vol. 60, No. 3, March 2002, pp. 389-395.
Back to Basics: Alternative Quantitative Methods for Screening Penetrant Testing Cleaning Solutions, Scott
Grendahl, ME, Vol. 59, No. 1, January 2001, pp. 26-34.
Back to Basics: An Introduction to Fracture Mechanics for Engineers and NDE Specialists, Part 1, M.F. Kanninen,
ME, Vol. 42, No. 4, April 1984, pp. 370–371.
Back to Basics: An Introduction to Fracture Mechanics for Engineers and NDE Specialists, Part 2, M.F. Kanninen,
ME, Vol. 42, No. 6, May 1984, pp. 658, 660, 662.
Back to Basics: An Introduction to Nondestructive Testing, Paul Dick, ME, Vol. 35, No. 9, September 1977, pp. 26,
28, 30, 32, 34, 36, 38, 40, 42, 44, 46.
Back to Basics: An Introduction to Nondestructive Testing, Paul Dick, ME, Vol. 35, No. 10, October 1977, pp. 31–
36.
Back to Basics: An Overview of the Nondestructive Inspection Techniques for Coiled Tubing and Pipe, Roderic K.
Stanley, ME, Vol. 54, No. 11, November 1996, pp. 1245–1250.
Back to Basics: An Untypical Fluorescent Penetrant Evaluation, William H. Bailey, ME, Vol. 40, No. 13, December
1982, pp. 1336, 1338–1340.
Back to Basics: Application of Nondestructive Inspection Methods to Composites, Thomas S. Jones and Harold
Berger, ME, Vol. 47, No. 4, April 1989, pp. 390–391, 393–398, 400.
Back to Basics: Application-Specific Thermal Imaging, John Newitt, ME, Vol. 45, No. 5, May 1987, pp. 500, 502,
504.
Back to Basics: Assuring NDT Radiographic Processing, George L. Becker, ME, Vol. 37, No. 8, July 1979, pp. 26–29.
Back to Basics: ASTM E-1417 Penetrant System Check: New Requirements and Test Pieces, Sam J. Robinson and
Amos Sherwin, ME, Vol. 57, No. 11, November 1999, pp. 1137-1141.
Back to Basics: Automated Leak Testing, Stuart Giles, ME, Vol. 42, No. 2, February 1984, pp. 146–149.
Back to Basics: Automated NDT, Frank A. Iddings, ME, Vol. 42, No. 12, November 1984, p. 1421.
Back to Basics: Back to Basics Without Going Backward: An Editorial, Frank Iddings, ME, Vol. 51, No. 1, January
1993, p. 17.
Back to Basics: Basics for Badges, Frank A. Iddings, ME, Vol. 61, No. 5, May 2003, pp. 565-566.
Back to Basics: Basics of Computed Tomography, Claudia Kropas-Hughes and S. Trent Neet, ME, Vol. 58, No. 5,
May 2000, pp. 630-633.
Back to Basics: Beam Sweeping and Encoded Phased Array Units, J. Mark Davis and Michael Moles, ME, Vol. 65,
No. 6, June 2007, pp. 539-541.
Back to Basics: Benefits and Limitations of Multiplexers in Ultrasonic Systems, L. Byron Makarwich, ME, Vol. 47,
No. 7, July 1989, pp. 777–778, 780 Erratum, ME, Vol. 47, No. 12, December 1989, p. 1424.