(including AR/VR), networked sensors and sensing, renewable energy gener- ation and storage, and space technol- ogies and systems. (For the full list, go to https://www.whitehouse.gov/ostp/ news-updates/2022/02/07/technolo gies-for-american-innovation-and-nation al-security/.) According to the White House, the list is intended as a useful resource that guides new and existing efforts to promote US technological leadership, cooperate with allies and partners, advance democratic values, attract and retain diverse science and technology talent from around the world, and protect against threats to US security. For example, on 21 January 2022, US Citizenship and Immigration Services, an agency in DHS, put in effect new policy guidance governing National Interest Waivers that utilizes the concept of critical and emerging technologies. The guid- ance stated that “USCIS recognizes the importance of progress in STEM fields and the essential role of persons with advanced STEM degrees in fostering this progress, especially in focused crit- ical and emerging technologies or other STEM areas important to US competitive- ness or national security.” PIRT TO DEVELOP HIGH-RES SWIR ELECTRO-OPTICAL SEEKER Princeton Infrared Technologies Inc. (PIRT), located in Monmouth Junction, New Jersey, and specialists in indium gallium arsenide (InGaAs) imaging tech- nology and affordable shortwave- infrared (SWIR) line scan cameras, visible-SWIR science cameras, and 1- and 2D imaging arrays, announced a Phase II Small Business Innovation Research (SBIR) award from the Office of the Secretary of Defense to fund the development of a megapixel high-reso- lution seeker with extended wavelength detection capability covering the entire SWIR range. The camera will have a high pixel operability with a digital output at greater than industry standard frame rate at full resolution. The imager will be manufac- tured on InP substrates using the InGaAs/ GaAsSb system allowing for low cost and the ability to utilize modern III-V semi- conductor processing. Additionally, the imager will be manufactured and hybrid- ized at wafer scale to minimize cost. IRISNDT ACQUIRES JAMES FISHER NDT IRISNDT announced the acquisition of James Fisher NDT from James Fisher and Sons PLC. James Fisher NDT has served the aerospace, defense, automo- tive, petrochemical, utilities, and nuclear markets since 2006, offering a wide array of field and laboratory NDT services. The component testing division of James Fisher NDT, providing quality control of manufactured parts, will continue to operate from its state-of-the-art 33 000 ft2 (3066 m2) facility, which includes eight radiographic bays, in Deeside, Wales, UK. IRISNDT is a privately owned NDT, inspection, and integrity engineering company with operations in the United States, Canada, the United Kingdom, and Australia. The company serves a blue-chip customer base in the refinery, petrochemical, chemical, agricultural, and power/renewables sectors around ongoing operational activities and main- tenance turnaround projects, as well as construction and expansion projects. The company is owned by IRISNDT employees and First Reserve, a private equity firm focused on energy and related industrial markets, and has 22 branch locations in the US, as well as nine in Canada, seven in the UK, and five in Australia. SCANNER | INDUSTRYNEWS We want to hear from you! News releases for Scanner should be submitted to Cara Markland, Assistant Editor, at cmarkland@asnt.org. www. .com • 2000 ASME & RFT tubes in stock - Same day shipping • Custom calibration standards • Mock-up exchangers / tube testing bundles • ('0QRWFKHVKROHVDQGÀDZV • S • Spiral notches & tube expansions • Corrosion simulation 10 M A T E R I A L S E V A L U A T I O N • A P R I L 2 0 2 2

Complete Ultrasonic Systems IntegraƟon for Your High-Performance Materials Matec Instrument Companies, Inc. | Northborough, MA | 1-508-393-0155 | sales@matec.com | matec.com • Multi-axis immersion tanks and gantries • New construction and system upgrades • C-scan and full waveform compatible • Conventional and phased array inspection