Take Us With You Stay informed with Chat NDT with ASNT—the podcast for NDT professionals featuring the latest information and interviews about the NDT industry. ASNT… CREATING A SAFER WORLD!® asnt.org/chatndt

| PARTICIPATE IN AMERICAN NATIONAL STANDARDS DEVELOPMENT ASNT’s Standards Council (StC) develops ASNT’s standards, including ASNT CP-105: ASNT Standard Training Outlines of Nondestructive Testing Personnel ANSI/ASNT CP-106: Nondestructive Testing — Qualification and Certification of Personnel ANSI/ASNT CP-189: ASNT Standard for Qualification and Certification of Nondestructive Testing Personnel and ANSI/ASNT ILI-PQ: In-line Inspection Personnel Qualification and Certification. If you wish to join the StC and participate in the development of American National Standards, contact StC Secretary Brian Frye at bfrye@asnt.org. CALL FOR HANDBOOK CONTRIBUTORS The technical editors for the forthcoming fourth edition of the Electromagnetic Handbook are looking for content ­Testing contributors. ET Level IIIs who are willing to share their deep knowledge—from the most basic principles to the most current techniques—are needed now to write and update content for this highly respected handbook. Don’t miss out on this opportu- nity to make a lasting contribution to your method’s body of knowledge and earn recertification points. To volunteer, please contact: ▶ ET Handbook – Henry Sadek hsadek@eddyfi.com For questions or additional information, please email ASNT Handbook Editor Karen Balkin at kbalkin@asnt.org. Patents Roundup provides a review of recent patents of interest to the NDT community. If you’ve been granted a patent and would like to see it featured in an upcoming issue, please email Patents Editor Saptarshi Mukherjee at mukherjee5@llnl.gov. DIGITAL IMAGE CORRELATION Digital image correlation (DIC) is an optical technique that combines image registration and tracking to accurately determine changes in images. In this issue, we focus on recent patents in DIC for nondestructive testing applications. US10488368B2 INTEGRATION OF DIGITAL IMAGE CORRELATION WITH ACOUSTIC EMISSION (Antonios Kontsos, Ivan Bartoli, and Prashanth Abraham Vanniamparambil) This patent describes an integration of acoustic emission testing (AE) and DIC for structural health monitoring of struc- tures, relevant to civil, aerospace, and mechanical industries. The AE system relies on passively recording acoustic stress waves propagating in the structure. The DIC system measures deformation in the structures based on load-induced movement. The correlation of the stress waves and the strain measurements are used to determine the health of the structure. The technique can also be used to determine the structure’s life frac- tion prediction, utilizing the cumulative acoustic energy and the residual stiffness of the structure. US10908055B2 EVALUATION OF APPLICATIONS USING DIGITAL IMAGE CORRELATION TECHNIQUES (Joel Thambi) This patent describes a method for eval- uating the lifetime of a material using DIC. A continuously varying stress field is applied to the material using load cycles over a time, while images of the material’s surfaces are continuously captured. A hysteresis area of a stable surface strain region is determined, which denotes the total loss energy. For low-cycle fatigue modeling, the deformation energy is calculated. For high-cycle fatigue modeling, a failure parameter is calcu- lated. These parameters can be used to determine the remaining useful life of the material. US9311566B2 METHOD AND SYSTEM FOR DIRECT STRAIN IMAGING (Athanasios Iliopoulos and John G. Michopoulos) This patent describes measurement and a computer-implemented method of full-field spatial distribution of strain field components due to deformation from loading. Single or multiple digital cameras are used to capture images that measure the deformation of optically distinct features. A method is described for determining the locations of char- acteristics points and then tracking the points because of deformation. A mathematical approach of least squares approximation is described in detail to measure the mean strain of components without the prior vulnerability to noise. PATENTSROUNDUP | SCANNER N O V E M B E R 2 0 2 2 • M AT E R I A L S E V A L U AT I O N 21